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Product Range
We supply sputtering targets which is manufactured under show unparalleled outstanding performance by virtue of high density, excellent purity, and distinguished homogeneous microstructure. The popular geometries featuring with both planar and rotatable shapes, such as circular, rectangular, ring, tube, cylinder and conicity, are all available. If you have your own unique requirements about the sputtering targets, no matter in density, purity, homogeneity or in geometry, please let us know exactly what you need. We'll do our utmost to meet your requirements precisely.
| Material | Specification |
| Sodalime glass | Sodalime glass 100X100X1.1mmt |
| Sodalime glass | Sodalime Glass, 100x100x2mmTh |
| Sodalime glass | Sodalime Glass, 100x100x3mmTh |
| Sodalime glass | Sodalime glass 300 x 400 x 1.1mmTh |
| Sodalime glass | Sodalime Glass 50X50X1.1mmt |
| XG2000 | XG2000 100x100x0.7mmTh |
| XG 2000 | XG2000 10x10x0.7mmTh |
| XG 2000 | XG2000 12x12x0.7mmTh |
| Eagle XG | Eagle XG 15 x 15x 0.7mmTh DSP |
| XG 2000 | XG2000 20x20x0.7mmTh |
| XG2000 | XG2000 25x25x0.7mmTh |
| XG 2000 | XG 2000 30x30x0.7mmTh |
| XG2000 | XG2000 50x50x0.7mmTh |
| GaAs | 500umTh undoped,<110>,2˚off,Prime SSP |
| Quartz | Quartz, wafer, 100mmDia x1mmTh |
| Quartz | Quartz, wafer, 100x100x1mmTh |
| Sapphire | 430umTh, C-plane+/-0.25degree 1 side- epi polished |
| Sapphire | (0001),430um,SSP |
| MgO | MgO Substrate, 10x10x0.5mmTh |
| silicon | N(test),(100),330um(+/-25),1-30ohmcm |
| Silicon | P-type,test grade,380um(+/-25),1~10ohmcm |
| Si | P-Type <100> 450umTh 1-20 ohmcm SSP test |
| Si | Si N-Type <100> 500mmTh 1-30 ohmcm SSP test |
| Silicon | Si P-Type <100> 500mmTh 0.001-0.003ohmcm SSP Prim |
| Si | Si,N-type<100> 275umTh,1-20ohm.Cm,ssp,test |
| Si | N-type<111> 300umTh,0.002-0.005ohm.Cm,ssp,test |
| Silicon | P-type,prime grade,275um(+/-25),1~30ohmcm |
| Si | Si,P-type<100> 300umTh, <0.005ohm.Cm,ssp,Prime |
| silicon | P(test),(100),275um(+/-25) 1~30ohmcm |
| Si wafer | Si,P-type<100> 330umTh,1-30ohm.Cm,ssp,test |
| Si wafer | si,p-type <100>500umTh 1-30ohm.Cm,ssp,test |
| Si | 3"Diax380um,<100>,N/P,1-10ohm,SSP,TEST |
| Silicon | P(prime grade) (100) 525umth ,1~30ohmcm |
| Silicon | P-type,test grade,500um(+/-25),1~30ohmcm |
| Si | 625um,<100>,P/B,1-30ohm,SSP,TEST |
| GaAs | 330um,SSP |
| GaP | 330um,SSP |
| ITO Glass | 10ohm,cm |
| Si wafer | Si P-Type <100> 675umTh 1-30 ohmcm SSP test |
| Si | N-Type <100> 500mmTh 0.001-0.0045ohmcm SSP Prime |
| Silicon | N-Type <100> 500mmTh 0.001-0.003ohmcm SSP Prime |
| Si | 525um,<111>,P/B,1-30ohm,SSP,TEST |
| Si | Si any <100> 675umTh SSP test |
| SiO2 | N-type <100>1-10um ssp prime wet 1000A |
| SiO2 | P-type <100>1-30um ssp prime wet 1000A |
| SiO2 | P-type <100>1-30um ssp prime wet 2000A |
| SiO2 | P-type <100>1-30um ssp prime wet 3000A |
| SiO2 | P-type <100>1-30um ssp prime wet 5000A |
| Si | Si P-Type <100> 675umTh 1-30 ohmcm SSP test |
| XG 2000 | XG2000 100 x 100 x 0.7mmTh DSP |
| XG 2000 | XG2000 100mmDia x 0.7mmTh DSP |